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Test Access Port

Майкр. Test Erişim Bağlantı Noktası (A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins, TCK/clock, TMS/mode select, TDI/data in, TDO/data out, and TRST/reset)
 Английский тезаурус
Test Access Port
ИТ., сокр. TAP (IC, IEEE 1149.1)