| Subject | English | French |
| IT | basic access test equipment | équipement de test d'accès de base |
| commun. | circuit test access point | point d'accès au circuit |
| commun. | circuit test access point | point d'accès pour les mesures de circuit |
| law | general access to the test plot by visitors | ouverture au public de la parcelle expérimentale |
| comp., MS | Test Access Port | accès TAP (A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins, TCK/clock, TMS/mode select, TDI/data in, TDO/data out, and TRST/reset) |