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| Test Access Port (A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins, TCK/clock, TMS/mode select, TDI/data in, TDO/data out, and TRST/reset) | |||
| Anglais glossaire | |||
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| TAP (IC, IEEE 1149.1) | |||
| |||
| Test Access Port (A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins, TCK/clock, TMS/mode select, TDI/data in, TDO/data out, and TRST/reset) | |||
| Anglais glossaire | |||
| |||
| TAP (IC, IEEE 1149.1) | |||
